TLP is the abbreviation for transmission-line pulse and is usually used to characterize measurement methods or equipment, where devices-under-test (DUT) are subjected to short current or voltage pulses. These pulses are created by the slow charging and abrupt discharging of a transmission line (ger.: Wanderwellenleitung).

Traditional TLP systems create pulses with durations of about 100ns. They are used to characterize DUTs for HBM stress.

Shorter stress durations are created by means of VF-TLP systems. VF-TLP is the abbreviation for very-fast transmission-line pulse and usually denotes pulses with durations less than 5ns. VF-TLP systems are typically used to characterize protection elements for CDM stress.

CC-TLP is the abbreviation for capacitively-coupled transmission-line pulse. Similar to CDM stress, CC-TLP allows to capacitively couple pulses into DUTs. In this way, CC-TLP systems achieve more realistic current distributions in complex DUTs (e.g. integrated circuits) than VF-TLP systems.